TY  - JOUR
AU  - Keppner, Johannes
AU  - Korte, Carsten
AU  - Schubert, Jürgen
AU  - Zander, Willi
AU  - Ziegner, Mirko
AU  - Stolten, Detlef
TI  - XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness
JO  - Solid state ionics
VL  - 273
SN  - 0167-2738
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - FZJ-2015-04977
SP  - 2 - 7
PY  - 2015
AB  - The strain in epitaxialmultilayerswith coherent interfaces between yttria stabilized zirconia and rare earth metaloxides is investigated as a function of the layer thickness. An analyticmodel was developed to describe the strain,which is analyzed bymeasuring distinct XRD reflections in two orientations. Applying our model to this data theinterface thickness δ0 is estimated. For Y2O3/YSZ multilayers δ0 is 9.3 nm and for Er2O3/YSZ multilayers δ0 is8.2 nm. Our findings are in accordance with the assumption that mismatch induced stress can be relaxed byelastic deformation
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000353929000002
DO  - DOI:10.1016/j.ssi.2014.09.012
UR  - https://juser.fz-juelich.de/record/202816
ER  -