% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Keppner:202816,
author = {Keppner, Johannes and Korte, Carsten and Schubert, Jürgen
and Zander, Willi and Ziegner, Mirko and Stolten, Detlef},
title = {{XRD} analysis of strain states in epitaxial
{YSZ}/{RE}2{O}3 ({RE}={Y}, {E}r) multilayers as a function
of layer thickness},
journal = {Solid state ionics},
volume = {273},
issn = {0167-2738},
address = {Amsterdam [u.a.]},
publisher = {Elsevier Science},
reportid = {FZJ-2015-04977},
pages = {2 - 7},
year = {2015},
abstract = {The strain in epitaxialmultilayerswith coherent interfaces
between yttria stabilized zirconia and rare earth
metaloxides is investigated as a function of the layer
thickness. An analyticmodel was developed to describe the
strain,which is analyzed bymeasuring distinct XRD
reflections in two orientations. Applying our model to this
data theinterface thickness δ0 is estimated. For Y2O3/YSZ
multilayers δ0 is 9.3 nm and for Er2O3/YSZ multilayers δ0
is8.2 nm. Our findings are in accordance with the assumption
that mismatch induced stress can be relaxed byelastic
deformation},
cin = {IEK-3 / PGI-9 / IEK-2 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)IEK-3-20101013 / I:(DE-Juel1)PGI-9-20110106 /
I:(DE-Juel1)IEK-2-20101013 / $I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000353929000002},
doi = {10.1016/j.ssi.2014.09.012},
url = {https://juser.fz-juelich.de/record/202816},
}