Home > Publications database > XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness > print

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100 1 _ |a Keppner, Johannes
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245 _ _ |a XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE=Y, Er) multilayers as a function of layer thickness
260 _ _ |a Amsterdam [u.a.]
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520 _ _ |a The strain in epitaxialmultilayerswith coherent interfaces between yttria stabilized zirconia and rare earth metaloxides is investigated as a function of the layer thickness. An analyticmodel was developed to describe the strain,which is analyzed bymeasuring distinct XRD reflections in two orientations. Applying our model to this data theinterface thickness δ0 is estimated. For Y2O3/YSZ multilayers δ0 is 9.3 nm and for Er2O3/YSZ multilayers δ0 is8.2 nm. Our findings are in accordance with the assumption that mismatch induced stress can be relaxed byelastic deformation
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700 1 _ |a Korte, Carsten
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700 1 _ |a Schubert, Jürgen
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700 1 _ |a Zander, Willi
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700 1 _ |a Ziegner, Mirko
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700 1 _ |a Stolten, Detlef
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773 _ _ |a 10.1016/j.ssi.2014.09.012
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