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@ARTICLE{Schmidt:203232,
      author       = {Schmidt, Matthias and Schäfer, Anna and Minamisawa, Renato
                      and Buca, Dan Mihai and Trellenkamp, Stefan and Hartmann,
                      Jean-Michel and Zhao, Qing-Tai and Mantl, Siegfried},
      title        = {{L}ine and {P}oint {T}unneling in {S}caled {S}i/{S}i{G}e
                      {H}eterostructure {TFET}s},
      journal      = {IEEE electron device letters},
      volume       = {35},
      number       = {7},
      issn         = {1558-0563},
      address      = {New York, NY},
      publisher    = {IEEE},
      reportid     = {FZJ-2015-05218},
      pages        = {699 - 701},
      year         = {2014},
      abstract     = {In this letter, we systematically investigate the impact of
                      gate length and channel orientation on the electrical
                      performance of tunneling field-effect transistors (TFETs).
                      We fabricate and characterize Si/SiGe heterostructure TFETs
                      with (p) -doped compressively strained Si0.5Ge0.5 source,
                      intrinsic Si channel, and (n) -doped Si drain. We observe a
                      linear relation of gate length, L $(_{mathrm$ {mathbf {g}}})
                      , and ON-current, I $(_{mathrm$ {{ON}}}) , which is the
                      first experimental proof of line tunneling occurring in a
                      TFET. TCAD simulations support our observations. After
                      forming gas annealing, short-channel TFETs exhibit different
                      I-V characteristics compared with long-channel devices due
                      to better passivation.},
      cin          = {PGI-9 / PGI-8-PT},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-8-PT-20110228},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000338662100004},
      doi          = {10.1109/LED.2014.2320273},
      url          = {https://juser.fz-juelich.de/record/203232},
}