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@ARTICLE{Mikulics:22691,
      author       = {Mikulics, M. and Hardtdegen, H. and Winden, A. and Fox, A.
                      and Marso, M. and Sofer, Z. and Lüth, H. and Grützmacher,
                      D. and Kordos, P.},
      title        = {{R}esidual strain in recessed {A}l{G}a{N}/{G}a{N}
                      heterostructure field-effect transistors evaluated by micro
                      photoluminescence measurements},
      journal      = {Physica status solidi / C},
      volume       = {9},
      issn         = {1610-1634},
      address      = {Berlin},
      publisher    = {Wiley-VCH},
      reportid     = {PreJuSER-22691},
      pages        = {911-914},
      year         = {2012},
      note         = {Record converted from VDB: 12.11.2012},
      cin          = {JARA-FIT / PGI-9},
      ddc          = {530},
      cid          = {$I:(DE-82)080009_20140620$ / I:(DE-Juel1)PGI-9-20110106},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000306521600124},
      doi          = {10.1002/pssc.201100408},
      url          = {https://juser.fz-juelich.de/record/22691},
}