Home > Publications database > On the origin of the kinetic growth instability of homoepitaxy on Si(001) > print |
001 | 24640 | ||
005 | 20180210130216.0 | ||
024 | 7 | _ | |2 DOI |a 10.1016/S0921-5107(01)00844-3 |
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037 | _ | _ | |a PreJuSER-24640 |
041 | _ | _ | |a eng |
082 | _ | _ | |a 600 |
084 | _ | _ | |2 WoS |a Materials Science, Multidisciplinary |
084 | _ | _ | |2 WoS |a Physics, Condensed Matter |
100 | 1 | _ | |a Myslivecek, J. |b 0 |u FZJ |0 P:(DE-Juel1)VDB9864 |
245 | _ | _ | |a On the origin of the kinetic growth instability of homoepitaxy on Si(001) |
260 | _ | _ | |a New York, NY [u.a.] |b Elsevier |c 2002 |
300 | _ | _ | |a 410 - 414 |
336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
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336 | 7 | _ | |a article |2 DRIVER |
440 | _ | 0 | |a Materials Science and Engineering B |x 0921-5107 |0 4204 |v 89 |
500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
520 | _ | _ | |a The recently observed kinetic growth instability of homoepitaxial layers on Si(001) was investigated by in-situ scanning tunneling microscopy (STM) experiments. In the step-flow, regime the instability consists of straight step bunches, and it vanishes both during two-dimensional (2-D) island growth and at high temperatures. Kinetic Monte Carlo (KMC) simulations were performed to identify the dominating mechanism causing the instability. Strong evidence for the presence of an asymmetric step-edge barrier with the behavior of an inverse Ehrlich-Schwoebel barrier is found. Comparison between the experiments and the simulations reveal that only double atomic height D-B steps, which form kinetically in a rather narrow temperature range, develop this type of step-edge barrier. (C) 2002 Published by Elsevier Science B.V. |
536 | _ | _ | |a Methoden und Systeme der Informationstechnik |c I02 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK253 |x 0 |
536 | _ | _ | |a Kondensierte Materie |c M02 |0 G:(DE-Juel1)FUEK242 |x 1 |
588 | _ | _ | |a Dataset connected to Web of Science |
650 | _ | 7 | |a J |2 WoSType |
653 | 2 | 0 | |2 Author |a step-bunching |
653 | 2 | 0 | |2 Author |a Si homoepitaxy |
653 | 2 | 0 | |2 Author |a Ehrlich-Schwoebel barrier |
653 | 2 | 0 | |2 Author |a kinetic Monte Carlo simulations |
653 | 2 | 0 | |2 Author |a scanning tunneling microscopy |
700 | 1 | _ | |a Schelling, C. |b 1 |0 P:(DE-HGF)0 |
700 | 1 | _ | |a Springholz, G. |b 2 |0 P:(DE-HGF)0 |
700 | 1 | _ | |a Schäffler, F. |b 3 |0 P:(DE-HGF)0 |
700 | 1 | _ | |a Voigtländer, B. |b 4 |u FZJ |0 P:(DE-Juel1)VDB5601 |
700 | 1 | _ | |a Smilauer, P. |b 5 |0 P:(DE-HGF)0 |
773 | _ | _ | |a 10.1016/S0921-5107(01)00844-3 |g Vol. 89, p. 410 - 414 |p 410 - 414 |q 89<410 - 414 |0 PERI:(DE-600)1492109-1 |t Materials science and engineering / B |v 89 |y 2002 |x 0921-5107 |
909 | C | O | |o oai:juser.fz-juelich.de:24640 |p VDB |
913 | 1 | _ | |k I02 |v Methoden und Systeme der Informationstechnik |l Informationstechnologie mit nanoelektronischen Systemen |b Information |0 G:(DE-Juel1)FUEK253 |x 0 |
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914 | 1 | _ | |y 2002 |
915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
920 | 1 | _ | |k ISG-3 |l Institut für Grenzflächen und Vakuumtechnologien |d 31.12.2006 |g ISG |0 I:(DE-Juel1)VDB43 |x 0 |
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