001     24640
005     20180210130216.0
024 7 _ |2 DOI
|a 10.1016/S0921-5107(01)00844-3
024 7 _ |2 WOS
|a WOS:000174015300087
037 _ _ |a PreJuSER-24640
041 _ _ |a eng
082 _ _ |a 600
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Myslivecek, J.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB9864
245 _ _ |a On the origin of the kinetic growth instability of homoepitaxy on Si(001)
260 _ _ |a New York, NY [u.a.]
|b Elsevier
|c 2002
300 _ _ |a 410 - 414
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Materials Science and Engineering B
|x 0921-5107
|0 4204
|v 89
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The recently observed kinetic growth instability of homoepitaxial layers on Si(001) was investigated by in-situ scanning tunneling microscopy (STM) experiments. In the step-flow, regime the instability consists of straight step bunches, and it vanishes both during two-dimensional (2-D) island growth and at high temperatures. Kinetic Monte Carlo (KMC) simulations were performed to identify the dominating mechanism causing the instability. Strong evidence for the presence of an asymmetric step-edge barrier with the behavior of an inverse Ehrlich-Schwoebel barrier is found. Comparison between the experiments and the simulations reveal that only double atomic height D-B steps, which form kinetically in a rather narrow temperature range, develop this type of step-edge barrier. (C) 2002 Published by Elsevier Science B.V.
536 _ _ |a Methoden und Systeme der Informationstechnik
|c I02
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK253
|x 0
536 _ _ |a Kondensierte Materie
|c M02
|0 G:(DE-Juel1)FUEK242
|x 1
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a step-bunching
653 2 0 |2 Author
|a Si homoepitaxy
653 2 0 |2 Author
|a Ehrlich-Schwoebel barrier
653 2 0 |2 Author
|a kinetic Monte Carlo simulations
653 2 0 |2 Author
|a scanning tunneling microscopy
700 1 _ |a Schelling, C.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Springholz, G.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Schäffler, F.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Voigtländer, B.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB5601
700 1 _ |a Smilauer, P.
|b 5
|0 P:(DE-HGF)0
773 _ _ |a 10.1016/S0921-5107(01)00844-3
|g Vol. 89, p. 410 - 414
|p 410 - 414
|q 89<410 - 414
|0 PERI:(DE-600)1492109-1
|t Materials science and engineering / B
|v 89
|y 2002
|x 0921-5107
909 C O |o oai:juser.fz-juelich.de:24640
|p VDB
913 1 _ |k I02
|v Methoden und Systeme der Informationstechnik
|l Informationstechnologie mit nanoelektronischen Systemen
|b Information
|0 G:(DE-Juel1)FUEK253
|x 0
913 1 _ |k M02
|v Kondensierte Materie
|l Kondensierte Materie
|b Materie
|0 G:(DE-Juel1)FUEK242
|x 1
914 1 _ |y 2002
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB43
|x 0
970 _ _ |a VDB:(DE-Juel1)16023
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-3-20110106


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21