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000025913 084__ $$2WoS$$aEngineering, Electrical & Electronic
000025913 084__ $$2WoS$$aPhysics, Applied
000025913 084__ $$2WoS$$aPhysics, Condensed Matter
000025913 1001_ $$0P:(DE-HGF)0$$aBachhofer, H.$$b0
000025913 245__ $$aInterfacial layers and their effect on leakage current in MOCVD-deposited SBT thin films
000025913 260__ $$aLondon [u.a.]$$bTaylor & Francis$$c2002
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000025913 440_0 $$02659$$aIntegrated Ferroelectrics$$v39$$x1058-4587
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000025913 520__ $$aStrontium bismuth tantalate (SBT) thin films were deposited on Pt/Ti electrodes by metalorganic chemical vapor deposition (MOCVD). Interactions at the interface of Pt and SBT and their effect on leakage current were investigated. High-resolution transmission electron micrographs (HRTEM) reveal that after annealing at 700degreesC, a 1-2 nm thick interfacial layer built. Auger electron spectra (AES) confirm that the constituents of SBT intermix with the Pt and vice versa. Schottky emission yields a nice linear fit to the leakage current data but the extracted values of the optical dielectric constant and the Richardson constant do not meet experimental values. Taking into account an interfacial layer with low dielectric constant and the effect of diffusion on the Schottky emission these inconsistencies can be resolved.
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000025913 65320 $$2Author$$aferroelectrics
000025913 65320 $$2Author$$aSBT
000025913 65320 $$2Author$$ainterfacial layer
000025913 65320 $$2Author$$aleakage current
000025913 7001_ $$0P:(DE-HGF)0$$aReisinger, H.$$b1
000025913 7001_ $$0P:(DE-HGF)0$$aSteinlesberger, G.$$b2
000025913 7001_ $$0P:(DE-HGF)0$$aNagel, W. E.$$b3
000025913 7001_ $$0P:(DE-HGF)0$$aCerva, H.$$b4
000025913 7001_ $$0P:(DE-HGF)0$$avon Philipsborn, H.$$b5
000025913 7001_ $$0P:(DE-Juel1)VDB3130$$aSchroeder, H.$$b6$$uFZJ
000025913 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7$$uFZJ
000025913 773__ $$0PERI:(DE-600)2037916-X$$gVol. 39, p. 289$$p289$$q39<289$$tIntegrated ferroelectrics$$v39$$x1058-4587$$y2002
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000025913 9141_ $$y2002
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000025913 9201_ $$0I:(DE-Juel1)VDB35$$d31.12.2003$$gIFF$$kIFF-EKM$$lElektrokeramische Materialien$$x0
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