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| 001 | 25913 | ||
| 005 | 20180210140724.0 | ||
| 024 | 7 | _ | |2 WOS |a WOS:000173066800022 |
| 037 | _ | _ | |a PreJuSER-25913 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 620 |
| 084 | _ | _ | |2 WoS |a Engineering, Electrical & Electronic |
| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 084 | _ | _ | |2 WoS |a Physics, Condensed Matter |
| 100 | 1 | _ | |a Bachhofer, H. |b 0 |0 P:(DE-HGF)0 |
| 245 | _ | _ | |a Interfacial layers and their effect on leakage current in MOCVD-deposited SBT thin films |
| 260 | _ | _ | |a London [u.a.] |b Taylor & Francis |c 2002 |
| 300 | _ | _ | |a 289 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a Integrated Ferroelectrics |x 1058-4587 |0 2659 |v 39 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 520 | _ | _ | |a Strontium bismuth tantalate (SBT) thin films were deposited on Pt/Ti electrodes by metalorganic chemical vapor deposition (MOCVD). Interactions at the interface of Pt and SBT and their effect on leakage current were investigated. High-resolution transmission electron micrographs (HRTEM) reveal that after annealing at 700degreesC, a 1-2 nm thick interfacial layer built. Auger electron spectra (AES) confirm that the constituents of SBT intermix with the Pt and vice versa. Schottky emission yields a nice linear fit to the leakage current data but the extracted values of the optical dielectric constant and the Richardson constant do not meet experimental values. Taking into account an interfacial layer with low dielectric constant and the effect of diffusion on the Schottky emission these inconsistencies can be resolved. |
| 536 | _ | _ | |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |c I01 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK252 |x 0 |
| 588 | _ | _ | |a Dataset connected to Web of Science |
| 650 | _ | 7 | |a J |2 WoSType |
| 653 | 2 | 0 | |2 Author |a ferroelectrics |
| 653 | 2 | 0 | |2 Author |a SBT |
| 653 | 2 | 0 | |2 Author |a interfacial layer |
| 653 | 2 | 0 | |2 Author |a leakage current |
| 700 | 1 | _ | |a Reisinger, H. |b 1 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Steinlesberger, G. |b 2 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Nagel, W. E. |b 3 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Cerva, H. |b 4 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a von Philipsborn, H. |b 5 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Schroeder, H. |b 6 |u FZJ |0 P:(DE-Juel1)VDB3130 |
| 700 | 1 | _ | |a Waser, R. |b 7 |u FZJ |0 P:(DE-Juel1)131022 |
| 773 | _ | _ | |g Vol. 39, p. 289 |p 289 |q 39<289 |0 PERI:(DE-600)2037916-X |t Integrated ferroelectrics |v 39 |y 2002 |x 1058-4587 |
| 909 | C | O | |o oai:juser.fz-juelich.de:25913 |p VDB |
| 913 | 1 | _ | |k I01 |v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |l Informationstechnologie mit nanoelektronischen Systemen |b Information |0 G:(DE-Juel1)FUEK252 |x 0 |
| 914 | 1 | _ | |y 2002 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
| 920 | 1 | _ | |k IFF-EKM |l Elektrokeramische Materialien |d 31.12.2003 |g IFF |0 I:(DE-Juel1)VDB35 |x 0 |
| 970 | _ | _ | |a VDB:(DE-Juel1)17299 |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a ConvertedRecord |
| 980 | _ | _ | |a journal |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
| 980 | _ | _ | |a UNRESTRICTED |
| 981 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
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