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@ARTICLE{Prume:25967,
      author       = {Prume, K. and Franken, K. and Böttger, U. and Waser, R.
                      and Maier, H.},
      title        = {{M}odelling and numerical simulation of the electrical,
                      mechanical and thermal coupled behaviour of {MLC}s},
      journal      = {Journal of the European Ceramic Society},
      volume       = {22},
      issn         = {0955-2219},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PreJuSER-25967},
      pages        = {1285 - 1296},
      year         = {2002},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The modelling of non-linear coupled material
                      characteristics has been used for finite element simulations
                      of the integral device behaviour and mechanical and
                      electrical stress distributions of ceramic multilayer
                      capacitors. A two-dimensional finite element model of
                      standard X7R-type capacitors of different sizes soldered on
                      a printed circuit board has been developed to calculate
                      residual, joining as well as mechanical and electrical load
                      stresses. This model includes the experimentally measured
                      non-linear bias field dependencies of the electric and
                      piezoelectric characteristics of the BaTiO3 based dielectric
                      material. The validation of the model is demonstrated by
                      calculations of the failure probability of soldered
                      capacitors in a four-point bending test under simultaneous
                      electrical loading. The results allow a description and
                      possible improvement of the short-time reliability under
                      particular load cases. (C) 2002 Elsevier Science Ltd. All
                      rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM},
      ddc          = {660},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000175329300013},
      doi          = {10.1016/S0955-2219(01)00439-3},
      url          = {https://juser.fz-juelich.de/record/25967},
}