000279266 001__ 279266 000279266 005__ 20210129221024.0 000279266 0247_ $$2doi$$a10.1109/JPROC.2015.2433311 000279266 0247_ $$2ISSN$$a0018-9219 000279266 0247_ $$2ISSN$$a1558-2256 000279266 0247_ $$2WOS$$aWOS:000358243500004 000279266 037__ $$aFZJ-2015-07281 000279266 082__ $$a620 000279266 1001_ $$0P:(DE-HGF)0$$aWouters, Dirk J.$$b0$$eCorresponding author 000279266 245__ $$aPhase-Change and Redox-Based Resistive Switching Memories 000279266 260__ $$aNew York, NY [u.a.]$$bInst.$$c2015 000279266 3367_ $$2DRIVER$$aarticle 000279266 3367_ $$2DataCite$$aOutput Types/Journal article 000279266 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1557382583_25693 000279266 3367_ $$2BibTeX$$aARTICLE 000279266 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000279266 3367_ $$00$$2EndNote$$aJournal Article 000279266 520__ $$aThis paper addresses the two main resistive switching (RS) memory technologies: phase-change memory (PCM) and redox-based resistive random access memory (ReRAM). It will review the basic concepts, the initial promises, and current state of the art, with focus on possible scaling pathways for low-power operation and dense, true 3-D memory. Recent physical insights and new potential concepts will be discussed 000279266 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0 000279266 588__ $$aDataset connected to CrossRef 000279266 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b1$$ufzj 000279266 7001_ $$0P:(DE-HGF)0$$aWuttig, Matthias$$b2 000279266 773__ $$0PERI:(DE-600)2040232-6$$a10.1109/JPROC.2015.2433311$$gVol. 103, no. 8, p. 1274 - 1288$$n8$$p1274 - 1288$$tProceedings of the IEEE$$v103$$x1558-2256$$y2015 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.pdf$$yRestricted 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.gif?subformat=icon$$xicon$$yRestricted 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.jpg?subformat=icon-1440$$xicon-1440$$yRestricted 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.jpg?subformat=icon-180$$xicon-180$$yRestricted 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.jpg?subformat=icon-640$$xicon-640$$yRestricted 000279266 8564_ $$uhttps://juser.fz-juelich.de/record/279266/files/07137622.pdf?subformat=pdfa$$xpdfa$$yRestricted 000279266 909CO $$ooai:juser.fz-juelich.de:279266$$pVDB 000279266 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich GmbH$$b1$$kFZJ 000279266 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich GmbH$$b2$$kFZJ 000279266 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0 000279266 9141_ $$y2015 000279266 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bP IEEE : 2013 000279266 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS 000279266 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline 000279266 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List 000279266 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index 000279266 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection 000279266 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded 000279266 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology 000279266 915__ $$0StatID:(DE-HGF)9905$$2StatID$$aIF >= 5$$bP IEEE : 2013 000279266 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0 000279266 9201_ $$0I:(DE-Juel1)PGI-10-20170113$$kPGI-10$$lJARA Institut Green IT$$x1 000279266 980__ $$ajournal 000279266 980__ $$aVDB 000279266 980__ $$aI:(DE-Juel1)PGI-7-20110106 000279266 980__ $$aI:(DE-Juel1)PGI-10-20170113 000279266 980__ $$aUNRESTRICTED