TY  - CONF
AU  - Schulte-Braucks, Christian
AU  - Lehndorff, Thomas
AU  - Glass, Stefan
AU  - von den Driesch, Nils
AU  - Wirths, Stephan
AU  - Hartmann, J. M.
AU  - Ikonic, Z.
AU  - Mantl, Siegfried
AU  - Buca, Dan Mihai
TI  - Investigation of ternary SiGeSn MOS structures
M1  - FZJ-2015-07828
PY  - 2015
T2  - Semiconductor Interface Specialist Conference
CY  - 2 Dec 2015 - 5 Dec 2015, Arlington (USA)
Y2  - 2 Dec 2015 - 5 Dec 2015
M2  - Arlington, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/280081
ER  -