%0 Conference Paper
%A Adepalli, K. K.
%A Moors, Marco
%A Lu, Q.
%A Wedig, Anja
%A Waser, R.
%A Tuller, H. L.
%A Valov, Ilia
%A Yildiz, B.
%T Characterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy
%M FZJ-2016-00689
%D 2015
%B European Materials Research Society meeting
%C 30 Nov 2015 - 4 Dec 2015, Boston (USA)
Y2 30 Nov 2015 - 4 Dec 2015
M2 Boston, USA
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/280978