000280978 001__ 280978
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000280978 037__ $$aFZJ-2016-00689
000280978 041__ $$aEnglish
000280978 1001_ $$0P:(DE-HGF)0$$aAdepalli, K. K.$$b0$$eCorresponding author
000280978 1112_ $$aEuropean Materials Research Society meeting$$cBoston$$d2015-11-30 - 2015-12-04$$wUSA
000280978 245__ $$aCharacterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy
000280978 260__ $$c2015
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000280978 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000280978 7001_ $$0P:(DE-Juel1)145323$$aMoors, Marco$$b1$$ufzj
000280978 7001_ $$0P:(DE-HGF)0$$aLu, Q.$$b2
000280978 7001_ $$0P:(DE-Juel1)162259$$aWedig, Anja$$b3$$ufzj
000280978 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b4$$ufzj
000280978 7001_ $$0P:(DE-HGF)0$$aTuller, H. L.$$b5
000280978 7001_ $$0P:(DE-Juel1)131014$$aValov, Ilia$$b6$$ufzj
000280978 7001_ $$0P:(DE-HGF)0$$aYildiz, B.$$b7
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000280978 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)162259$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000280978 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000280978 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131014$$aForschungszentrum Jülich GmbH$$b6$$kFZJ
000280978 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000280978 9141_ $$y2015
000280978 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000280978 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
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