TY  - CONF
AU  - Adepalli, K. K.
AU  - Moors, Marco
AU  - Lu, Q.
AU  - Wedig, Anja
AU  - Waser, R.
AU  - Tuller, H. L.
AU  - Valov, Ilia
AU  - Yildiz, B.
TI  - Characterization of TaOx Resistive Switching Memory Devices by Scanning Tunneling Microscopy
M1  - FZJ-2016-00689
PY  - 2015
T2  - European Materials Research Society meeting
CY  - 30 Nov 2015 - 4 Dec 2015, Boston (USA)
Y2  - 30 Nov 2015 - 4 Dec 2015
M2  - Boston, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/280978
ER  -