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Transport limits in defect-engineered LaAlO3/SrTiO3 bilayers
Gunkel, F.FZJ* ; Heinen, R. ; Wicklein, S. ; Hoffmann-Eifert, S.FZJ* ; Meuffels, P.FZJ* ; Brings, P. ; Huijben, M. ; Rijnders, G. ; Waser, R.FZJ* ; Dittmann, R.FZJ*
2015
2015COST Action - Towards oxide-based electronics, AveiroAveiro, Portugal, 12 Sep 2016 - 16 Sep 20162016-09-122016-09-16
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
Appears in the scientific report
2015
Database coverage:No Authors Fulltext