%0 Conference Paper
%A Zhang, Hehe
%A Funck, Carsten
%A Hoffmann-Eifert, Susanne
%T Resistive Switching Behavior in ReRAM Cells of Oxide Bilayers grown by Atomic Layer Deposition
%M FZJ-2016-00790
%D 2015
%B Nanoelectronics Days
%C 25 May 2015 - 29 May 2015, Jülich (Germany)
Y2 25 May 2015 - 29 May 2015
M2 Jülich, Germany
%F PUB:(DE-HGF)24
%9 Poster
%U https://juser.fz-juelich.de/record/281085