TY  - CONF
AU  - Zhang, Hehe
AU  - Funck, Carsten
AU  - Hoffmann-Eifert, Susanne
TI  - Resistive Switching Behavior in ReRAM Cells of Oxide Bilayers grown by Atomic Layer Deposition
M1  - FZJ-2016-00790
PY  - 2015
T2  - Nanoelectronics Days
CY  - 25 May 2015 - 29 May 2015, Jülich (Germany)
Y2  - 25 May 2015 - 29 May 2015
M2  - Jülich, Germany
LB  - PUB:(DE-HGF)24
UR  - https://juser.fz-juelich.de/record/281085
ER  -