%0 Conference Paper
%A Voigtländer, B.
%T Fundamental processes in Si/Si and Ge/Si epitaxy studied by scanning tunneling microscopy during growth
%M PreJuSER-28249
%D 2000
%Z Record converted from VDB: 12.11.2012
%< Kolloquium Institut für Festkörper- und Halbleiterphysik : Universität Linz
Y2 18 Dec 2000
M2 Linz, 
%F PUB:(DE-HGF)31
%9 Talk (non conference)
%U https://juser.fz-juelich.de/record/28249