TY  - CONF
AU  - Voigtländer, B.
TI  - Fundamental processes in Si/Si and Ge/Si epitaxy studied by scanning tunneling microscopy during growth
M1  - PreJuSER-28249
PY  - 2000
N1  - Record converted from VDB: 12.11.2012
Y2  - 18 Dec 2000
M2  - Linz, 
LB  - PUB:(DE-HGF)31
UR  - https://juser.fz-juelich.de/record/28249
ER  -