000029426 001__ 29426 000029426 005__ 20180210131258.0 000029426 0247_ $$2DOI$$a10.1080/10584580108222312 000029426 0247_ $$2WOS$$aWOS:000167524500032 000029426 037__ $$aPreJuSER-29426 000029426 041__ $$aeng 000029426 082__ $$a620 000029426 084__ $$2WoS$$aEngineering, Electrical & Electronic 000029426 084__ $$2WoS$$aPhysics, Applied 000029426 084__ $$2WoS$$aPhysics, Condensed Matter 000029426 1001_ $$0P:(DE-Juel1)VDB2799$$aSzot, K.$$b0$$uFZJ 000029426 245__ $$aSegregation phenomena in thin films of BaTio3 000029426 260__ $$aLondon [u.a.]$$bTaylor & Francis$$c2001 000029426 300__ $$a303 -310 000029426 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article 000029426 3367_ $$2DataCite$$aOutput Types/Journal article 000029426 3367_ $$00$$2EndNote$$aJournal Article 000029426 3367_ $$2BibTeX$$aARTICLE 000029426 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000029426 3367_ $$2DRIVER$$aarticle 000029426 440_0 $$02659$$aIntegrated Ferroelectrics$$v33$$x1058-4587 000029426 500__ $$aRecord converted from VDB: 12.11.2012 000029426 520__ $$aThe near-surface region in perovskite bulk crystals is known to be subject to segregation processes at elevated temperatures which can lead to the formation of non-perovskite phases. We have addressed the question whether analogue phenomena may occur in thin films, Thin films of BaTiO3 prepared by different methods (PLD, CSD) and heat-treated in the temperature range of 700 degreesC-1000 degreesC are characterised by surface analytical methods and microanalysis (AFM, SIMS, XPS). Our studies reveals dramatic changes in the surface morphology and in-depth elemental distribution suggesting a chemical restructuring comparable to the effects known for single crystalline BaTiO3. Possible driving forces for the observed segregation phenomena are discussed taking into account specific properties of the thin films. 000029426 536__ $$0G:(DE-Juel1)FUEK118$$2G:(DE-HGF)$$aEntwicklung analytischer Verfahren$$c62.10.1$$x0 000029426 536__ $$0G:(DE-Juel1)FUEK54$$aFestkörperforschung für die Informationstechnik$$c23.42.0$$x1 000029426 588__ $$aDataset connected to Web of Science 000029426 650_7 $$2WoSType$$aJ 000029426 65320 $$2Author$$athin films 000029426 65320 $$2Author$$asurface layer 000029426 65320 $$2Author$$asurface segregation 000029426 65320 $$2Author$$asurface morphology 000029426 65320 $$2Author$$aatomic force microscopy 000029426 7001_ $$0P:(DE-Juel1)VDB630$$aHoffmann, S.$$b1$$uFZJ 000029426 7001_ $$0P:(DE-Juel1)125382$$aSpeier, W.$$b2$$uFZJ 000029426 7001_ $$0P:(DE-Juel1)VDB2782$$aBreuer, U.$$b3$$uFZJ 000029426 7001_ $$0P:(DE-Juel1)VDB2542$$aSiegert, M.$$b4$$uFZJ 000029426 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$uFZJ 000029426 773__ $$0PERI:(DE-600)2037916-X$$a10.1080/10584580108222312$$gVol. 33, p. 303 -310$$p303 -310$$q33<303 -310$$tIntegrated ferroelectrics$$v33$$x1058-4587$$y2001 000029426 909CO $$ooai:juser.fz-juelich.de:29426$$pVDB 000029426 9131_ $$0G:(DE-Juel1)FUEK118$$bEnergietechnik$$k62.10.1$$lWerkstoffe der Energietechnik$$vEntwicklung analytischer Verfahren$$x0 000029426 9131_ $$0G:(DE-Juel1)FUEK54$$bInformationstechnik$$k23.42.0$$lGrundlagenforschung zur Informationstechnik$$vFestkörperforschung für die Informationstechnik$$x1 000029426 9141_ $$y2001 000029426 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed 000029426 9201_ $$0I:(DE-Juel1)ZCH-20090406$$gZCH$$kZCH$$lZentralabteilung für Chemische Analysen$$x0 000029426 9201_ $$0I:(DE-Juel1)VDB35$$d31.12.2003$$gIFF$$kIFF-EKM$$lElektrokeramische Materialien$$x1 000029426 970__ $$aVDB:(DE-Juel1)2631 000029426 980__ $$aVDB 000029426 980__ $$aConvertedRecord 000029426 980__ $$ajournal 000029426 980__ $$aI:(DE-Juel1)ZEA-3-20090406 000029426 980__ $$aI:(DE-Juel1)PGI-7-20110106 000029426 980__ $$aUNRESTRICTED 000029426 981__ $$aI:(DE-Juel1)ZEA-3-20090406 000029426 981__ $$aI:(DE-Juel1)PGI-7-20110106 000029426 981__ $$aI:(DE-Juel1)ZCH-20090406