%0 Journal Article
%A Schroeder, H.
%A Schmitz, S.
%A Meuffels, P.
%T Leakage currents in high-permittivity thin films
%J Applied physics letters
%V 82
%@ 0003-6951
%C Melville, NY
%I American Institute of Physics
%M PreJuSER-32006
%P 781
%D 2003
%Z Record converted from VDB: 12.11.2012
%X Quite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extracted permittivity at optical frequencies seldom is in agreement with experimental values and often is unacceptably small, i.e., <1. We suggest a model demonstrating that the leakage current in high-permittivity thin films is bulk-limited, but still is showing the characteristic dependence of thermionic emission. This is due to a combination of boundary conditions of the model, low-permittivity thin layers ("dead layer") at the electrodes and current injection/recombination terms at the injecting/collecting electrodes, respectively. (C) 2003 American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000180687600040
%R 10.1063/1.1541096
%U https://juser.fz-juelich.de/record/32006