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000032006 0247_ $$2DOI$$a10.1063/1.1541096
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000032006 084__ $$2WoS$$aPhysics, Applied
000032006 1001_ $$0P:(DE-Juel1)VDB3130$$aSchroeder, H.$$b0$$uFZJ
000032006 245__ $$aLeakage currents in high-permittivity thin films
000032006 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2003
000032006 300__ $$a781
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000032006 440_0 $$0562$$aApplied Physics Letters$$v82$$x0003-6951
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000032006 520__ $$aQuite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extracted permittivity at optical frequencies seldom is in agreement with experimental values and often is unacceptably small, i.e., <1. We suggest a model demonstrating that the leakage current in high-permittivity thin films is bulk-limited, but still is showing the characteristic dependence of thermionic emission. This is due to a combination of boundary conditions of the model, low-permittivity thin layers ("dead layer") at the electrodes and current injection/recombination terms at the injecting/collecting electrodes, respectively. (C) 2003 American Institute of Physics.
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000032006 7001_ $$0P:(DE-Juel1)VDB15087$$aSchmitz, S.$$b1$$uFZJ
000032006 7001_ $$0P:(DE-Juel1)130836$$aMeuffels, P.$$b2$$uFZJ
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