TY  - JOUR
AU  - Schroeder, H.
AU  - Schmitz, S.
AU  - Meuffels, P.
TI  - Leakage currents in high-permittivity thin films
JO  - Applied physics letters
VL  - 82
SN  - 0003-6951
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-32006
SP  - 781
PY  - 2003
N1  - Record converted from VDB: 12.11.2012
AB  - Quite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extracted permittivity at optical frequencies seldom is in agreement with experimental values and often is unacceptably small, i.e., <1. We suggest a model demonstrating that the leakage current in high-permittivity thin films is bulk-limited, but still is showing the characteristic dependence of thermionic emission. This is due to a combination of boundary conditions of the model, low-permittivity thin layers ("dead layer") at the electrodes and current injection/recombination terms at the injecting/collecting electrodes, respectively. (C) 2003 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000180687600040
DO  - DOI:10.1063/1.1541096
UR  - https://juser.fz-juelich.de/record/32006
ER  -