% IMPORTANT: The following is UTF-8 encoded. This means that in the presence % of non-ASCII characters, it will not work with BibTeX 0.99 or older. % Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or % “biber”. @ARTICLE{Schroeder:32006, author = {Schroeder, H. and Schmitz, S. and Meuffels, P.}, title = {{L}eakage currents in high-permittivity thin films}, journal = {Applied physics letters}, volume = {82}, issn = {0003-6951}, address = {Melville, NY}, publisher = {American Institute of Physics}, reportid = {PreJuSER-32006}, pages = {781}, year = {2003}, note = {Record converted from VDB: 12.11.2012}, abstract = {Quite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extracted permittivity at optical frequencies seldom is in agreement with experimental values and often is unacceptably small, i.e., <1. We suggest a model demonstrating that the leakage current in high-permittivity thin films is bulk-limited, but still is showing the characteristic dependence of thermionic emission. This is due to a combination of boundary conditions of the model, low-permittivity thin layers ("dead layer") at the electrodes and current injection/recombination terms at the injecting/collecting electrodes, respectively. (C) 2003 American Institute of Physics.}, keywords = {J (WoSType)}, cin = {IFF-EKM}, ddc = {530}, cid = {I:(DE-Juel1)VDB35}, pnm = {Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik / Kondensierte Materie}, pid = {G:(DE-Juel1)FUEK252 / G:(DE-Juel1)FUEK242}, shelfmark = {Physics, Applied}, typ = {PUB:(DE-HGF)16}, UT = {WOS:000180687600040}, doi = {10.1063/1.1541096}, url = {https://juser.fz-juelich.de/record/32006}, }