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@ARTICLE{Schroeder:32008,
      author       = {Schroeder, H. and Schmitz, S. and Meuffels, P.},
      title        = {{S}imulation of leakage current in thin films with dead
                      layers},
      journal      = {Integrated ferroelectrics},
      volume       = {47},
      issn         = {1058-4587},
      address      = {London [u.a.]},
      publisher    = {Taylor $\&$ Francis},
      reportid     = {PreJuSER-32008},
      pages        = {197},
      year         = {2002},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {There is a long-standing debate on the interpretation of
                      leakage current data in metal/insulator/metal capacitors
                      with high permittivity or ferroelectric materials such as
                      SrTiO3, (Ba,Sr)TiO3 or Pb (Zr,Ti)O-3, respectively: Is the
                      leakage current density, j, interface or bulk limited? Many
                      data sets have been interpreted as interface limited by
                      thermionic emission over a barrier lowered by the combined
                      effect of mirror potential and applied field
                      ("Schottky-effect") as these data show linear behaviour in
                      the dependencies on temperature, T, in an "Arrhenius plot"
                      ln(j/T-2) vs. l/T and on the average field, <E>, in a plot
                      ln(j) vs. sqrt (<E>) ("Schottky-plot"). However, the
                      absolute values of j are in many cases much smaller than the
                      prediction (value of the effective "Richardson constant")
                      and - much more serious - the optical dielectric constant
                      deduced from the "Schottky-plot" is very often smaller than
                      1, an unphysical value. In order to correct the last much
                      higher electrical fields at or near the interface, E-0 >>
                      <E>, would be necessary. One possibility is the introduction
                      of interface layers with low dielectric constant, "dead"
                      layers, supported by theoretical investigations and
                      capacitance data measured at different thickness.We have
                      performed computer simulations to calculate the "bulk
                      limited" steady state leakage current density through thin
                      insulating films (with "dead" layers) employing the "Finite
                      Difference Method". Parameters, which have been varied, are
                      external ones, such as temperature, applied voltage, film
                      thickness and interfacial barrier height (electrode
                      material), and internal ones, such as dielectric constant
                      and defect concentration of the "bulk" film, thickness and
                      dielectric constant of the "dead layers".The most important
                      result is: For nearly all values of the parameter field the
                      calculated "bulk limited" current density through the thin
                      film shows nearly perfect "Schottky-" and "Arrhenius" plots
                      which - interpreted by the simple "Schottky" model - have
                      the same deficiencies as mentioned above: too small
                      Richardson constant and unphysical dielectric constant.},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM},
      ddc          = {620},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Engineering, Electrical $\&$ Electronic / Physics, Applied
                      / Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000179829400023},
      doi          = {10.1080/10584580190044669},
      url          = {https://juser.fz-juelich.de/record/32008},
}