000032035 001__ 32035
000032035 005__ 20240610121336.0
000032035 017__ $$aThis version is available at the following Publisher URL: http://apl.aip.org
000032035 0247_ $$2DOI$$a10.1063/1.1590431
000032035 0247_ $$2WOS$$aWOS:000183877800043
000032035 0247_ $$2Handle$$a2128/1240
000032035 0247_ $$2altmetric$$aaltmetric:21810429
000032035 037__ $$aPreJuSER-32035
000032035 041__ $$aeng
000032035 082__ $$a530
000032035 084__ $$2WoS$$aPhysics, Applied
000032035 1001_ $$0P:(DE-Juel1)VDB5562$$aRodriguez Contreras, J.$$b0$$uFZJ
000032035 245__ $$aSurface treatment effects on the thickness dependence of the remanent polarization of PbZr0.52Ti0.48O3 capacitors
000032035 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2003
000032035 300__ $$a126
000032035 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000032035 3367_ $$2DataCite$$aOutput Types/Journal article
000032035 3367_ $$00$$2EndNote$$aJournal Article
000032035 3367_ $$2BibTeX$$aARTICLE
000032035 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000032035 3367_ $$2DRIVER$$aarticle
000032035 440_0 $$0562$$aApplied Physics Letters$$v83$$x0003-6951$$y1
000032035 500__ $$aRecord converted from VDB: 12.11.2012
000032035 520__ $$aIn this letter, we report on the thickness dependence of the remanent polarization of Pt/PbZr0.52Ti0.48O3/SrRuO3 capacitors. Two different patterning techniques were used to fabricate the capacitors. For lift-off processed capacitors, the remanent polarization decreased with decreasing thickness. Ion-beam-etched capacitors, however, showed a constant remanent polarization for all PbZr0.52Ti0.48O3 film thicknesses down to 23 nm. Remarkably, this constant remanent polarization for ion-beam-etched capacitors corresponds to the spontaneous polarization expected for a stress-free bulk PbZr0.52Ti0.48O3 crystal. (C) 2003 American Institute of Physics.
000032035 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die  Mikro- und Nanoelektronik$$cI01$$x0
000032035 536__ $$0G:(DE-Juel1)FUEK242$$aKondensierte Materie$$cM02$$x1
000032035 588__ $$aDataset connected to Web of Science
000032035 650_7 $$2WoSType$$aJ
000032035 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b1$$uFZJ
000032035 7001_ $$0P:(DE-Juel1)VDB21377$$aPoppe, U.$$b2$$uFZJ
000032035 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b3$$uFZJ
000032035 7001_ $$0P:(DE-Juel1)VDB14557$$aBuchal, Ch.$$b4$$uFZJ
000032035 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.1590431$$gVol. 83, p. 126$$p126$$q83<126$$tApplied physics letters$$v83$$x0003-6951$$y2003
000032035 8567_ $$uhttp://hdl.handle.net/2128/1240$$uhttp://dx.doi.org/10.1063/1.1590431
000032035 8564_ $$uhttps://juser.fz-juelich.de/record/32035/files/33484.pdf$$yOpenAccess
000032035 8564_ $$uhttps://juser.fz-juelich.de/record/32035/files/33484.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000032035 8564_ $$uhttps://juser.fz-juelich.de/record/32035/files/33484.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000032035 8564_ $$uhttps://juser.fz-juelich.de/record/32035/files/33484.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000032035 909CO $$ooai:juser.fz-juelich.de:32035$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000032035 9131_ $$0G:(DE-Juel1)FUEK252$$bInformation$$kI01$$lInformationstechnologie mit nanoelektronischen Systemen$$vMaterialien, Prozesse und Bauelemente für die  Mikro- und Nanoelektronik$$x0
000032035 9131_ $$0G:(DE-Juel1)FUEK242$$bMaterie$$kM02$$lKondensierte Materie$$vKondensierte Materie$$x1
000032035 9141_ $$y2003
000032035 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000032035 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000032035 9201_ $$0I:(DE-Juel1)VDB35$$d31.12.2003$$gIFF$$kIFF-EKM$$lElektrokeramische Materialien$$x0
000032035 9201_ $$0I:(DE-Juel1)VDB41$$d31.12.2006$$gISG$$kISG-1$$lInstitut für Halbleiterschichten und Bauelemente$$x1
000032035 9201_ $$0I:(DE-Juel1)VDB37$$d31.12.2006$$gIFF$$kIFF-IMF$$lMikrostrukturforschung$$x2
000032035 970__ $$aVDB:(DE-Juel1)33484
000032035 9801_ $$aFullTexts
000032035 980__ $$aVDB
000032035 980__ $$aJUWEL
000032035 980__ $$aConvertedRecord
000032035 980__ $$ajournal
000032035 980__ $$aI:(DE-Juel1)PGI-7-20110106
000032035 980__ $$aI:(DE-Juel1)PGI-9-20110106
000032035 980__ $$aI:(DE-Juel1)PGI-5-20110106
000032035 980__ $$aUNRESTRICTED
000032035 980__ $$aFullTexts
000032035 981__ $$aI:(DE-Juel1)ER-C-1-20170209
000032035 981__ $$aI:(DE-Juel1)PGI-7-20110106
000032035 981__ $$aI:(DE-Juel1)PGI-9-20110106
000032035 981__ $$aI:(DE-Juel1)PGI-5-20110106