%0 Journal Article
%A Voigtländer, B.
%T Scanning tunneling microscopy study of Si and Ge on Silicon
%J Reviews on advanced materials science
%V 4
%@ 1605-8127
%C St. Petersburg
%I Advanced Study Center
%M PreJuSER-35288
%P 10 - 14
%D 2003
%Z Record converted from VDB: 12.11.2012
%F PUB:(DE-HGF)16
%9 Journal Article
%U https://juser.fz-juelich.de/record/35288