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Journal Article PreJuSER-35288
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Scanning tunneling microscopy study of Si and Ge on Silicon



2003
Advanced Study Center St. Petersburg

Reviews on advanced materials science 4, 10 - 14 ()

Classification:

Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
  1. Institut für Grenzflächen und Vakuumtechnologien (ISG-3)
Research Program(s):
  1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)

Appears in the scientific report 2003
Notes: Nachtrag
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Document types > Articles > Journal Article
Institute Collections > PGI > PGI-3
Workflow collections > Public records
Publications database
 Record created 2012-11-13, last modified 2018-02-10
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