TY  - JOUR
AU  - Voigtländer, B.
TI  - Scanning tunneling microscopy study of Si and Ge on Silicon
JO  - Reviews on advanced materials science
VL  - 4
SN  - 1605-8127
CY  - St. Petersburg
PB  - Advanced Study Center
M1  - PreJuSER-35288
SP  - 10 - 14
PY  - 2003
N1  - Record converted from VDB: 12.11.2012
LB  - PUB:(DE-HGF)16
UR  - https://juser.fz-juelich.de/record/35288
ER  -