| Hauptseite > Publikationsdatenbank > Scanning tunneling microscopy study of Si and Ge on Silicon > print |
| 001 | 35288 | ||
| 005 | 20180210140530.0 | ||
| 024 | 7 | _ | |a 1605-8127 |2 ISSN |
| 037 | _ | _ | |a PreJuSER-35288 |
| 082 | _ | _ | |a 530 |
| 100 | 1 | _ | |a Voigtländer, B. |b 0 |u FZJ |0 P:(DE-Juel1)VDB5601 |
| 245 | _ | _ | |a Scanning tunneling microscopy study of Si and Ge on Silicon |
| 260 | _ | _ | |a St. Petersburg |b Advanced Study Center |c 2003 |
| 300 | _ | _ | |a 10 - 14 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a Reviews on Advanced Materials Science |x 1605-8127 |0 9916 |v 4 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 536 | _ | _ | |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |c I01 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK252 |x 0 |
| 773 | _ | _ | |g Vol. 4, p. 10 - 14 |p 10 - 14 |q 4<10 - 14 |0 PERI:(DE-600)2033066-2 |t Reviews on advanced materials science |v 4 |y 2003 |x 1605-8127 |
| 909 | C | O | |o oai:juser.fz-juelich.de:35288 |p VDB |
| 913 | 1 | _ | |k I01 |v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |l Informationstechnologie mit nanoelektronischen Systemen |b Information |0 G:(DE-Juel1)FUEK252 |x 0 |
| 914 | 1 | _ | |a Nachtrag |y 2003 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0020 |a No peer review |
| 920 | 1 | _ | |k ISG-3 |l Institut für Grenzflächen und Vakuumtechnologien |d 31.12.2006 |g ISG |0 I:(DE-Juel1)VDB43 |x 0 |
| 970 | _ | _ | |a VDB:(DE-Juel1)42226 |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a ConvertedRecord |
| 980 | _ | _ | |a journal |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-3-20110106 |
| 980 | _ | _ | |a UNRESTRICTED |
| 981 | _ | _ | |a I:(DE-Juel1)PGI-3-20110106 |
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