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| Home > Publications database > Nondestructive measurement of surface tritium by beta-ray X-ray spectrometry (BIXS) |
| Journal Article | PreJuSER-37952 |
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2001
Elsevier Science
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/S0022-3115(00)00581-X
Abstract: Applicability of a newly developed beta -ray induced X-ray spectrometry (BIXS) has been examined to measure nondestructively tritium retained on/in the graphite samples. Examination was carried out by using the graphite plates irradiated with tritium ions and an ALT-II limiter tile exposed to D-plasmas in TEXTOR. For the former samples, a sharp intense peak and a broad weak peak appeared clearly in the spectra; the former peak was attributed to the characteristic X-rays from argon used as a working gas, and the latter peak was assigned to the bremsstrahlung X-rays from sub-surface layers of graphite. On the other hand, for the latter sample, a rather weak characteristic X-ray peak was observed along with a diminutive bremsstrahlung X-ray peak. Although the intensities of those X-rays differed from spot to spot, the tritium levels retained on the limiter tile were determined to be 58-132 Bq/cm(2). It was concluded, therefore, that valuable information on the amount and the distribution of tritium retained on/in the wall materials can be nondestructively obtained by using the BIXS. (C) 2001 Elsevier Science B.V. All rights reserved.
Keyword(s): J ; surface tritium measurement (auto) ; beta-ray induced X-ray spectrometry (BIXS) (auto) ; tritium retention (auto) ; graphite materials (auto)
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