% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Soni:3986,
author = {Soni, R. and Meuffels, P. and Kohlstedt, H. and Kügeler,
C. and Waser, R.},
title = {{R}eliability analysis of the low resistance state
stability of ${G}e_0.3{S}e_0.7$ based solid electrolyte
nonvolatile memory cells},
journal = {Applied physics letters},
volume = {94},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-3986},
pages = {123503},
year = {2009},
note = {Record converted from VDB: 12.11.2012},
abstract = {We report on the low resistance state (LRS) stability
analysis of Ge0.3Se0.7 based solid electrolyte nonvolatile
memory cells under elevated temperature and bias current
stress conditions. The activation energy was found to be
about 1.02 eV, which is comparable to that of an
electromigration-induced failure process. Experimental
results also show that there is trade-off between the LRS
stability and the thickness of Ge0.3Se0.7 layer.},
keywords = {J (WoSType)},
cin = {IFF-6 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000264633500074},
doi = {10.1063/1.3103555},
url = {https://juser.fz-juelich.de/record/3986},
}