TY  - JOUR
AU  - Heinsohn, J.-K.
AU  - Dittmann, R.
AU  - Rodriguez Contreras, J.
AU  - Scherbel, J.
AU  - Klushin, A. M.
AU  - Siegel, M.
AU  - Jia, C. L.
AU  - Golubov, A.
AU  - Kupriyanov, M. Y.
TI  - Current transport in ramp-type junctions with engineered interface
JO  - Journal of applied physics
VL  - 89
SN  - 0021-8979
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-39991
SP  - 3852
PY  - 2001
N1  - Record converted from VDB: 12.11.2012
AB  - The transport properties of "interface-engineered" edge-type YBa2Cu3O7 Josephson junctions are investigated in detail. We have investigated the dependence of the current-voltage characteristics on external magnetic field, temperature, and microwave irradiation and compare them to the resistively shunted junction model. The temperature dependence of the critical current and the normal resistance allows us to draw conclusions to the transport of quasiparticles and Cooper pairs in the investigated "interface-engineered" junctions. We have studied the properties of junctions for which La doped YBa2Cu3O7 is used for the superconducting electrodes. We will propose a model for the undoped and the La doped case which takes into account a barrier which consists of a series connection of a normal conducting layer and an insulator, containing superconducting microconstrictions. (C) 2001 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000167610900050
DO  - DOI:10.1063/1.1351056
UR  - https://juser.fz-juelich.de/record/39991
ER  -