% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Hobein:40486,
      author       = {Hobein, B. and Tietz, F. and Stöver, D. and Cekada, M. and
                      Panjan, L. M.},
      title        = {{DC}-sputtering of yttria-stabilised zirconia films for
                      solid oxide fuel cell applications},
      journal      = {Journal of the European Ceramic Society},
      volume       = {21},
      issn         = {0955-2219},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PreJuSER-40486},
      pages        = {1843 - 1846},
      year         = {2001},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Yttria-stabilised zirconia (YSZ) thin films were
                      dc-sputtered and investigated with respect to surface
                      morphology, microstructure and film-substrate interface
                      interaction. The films were deposited under argon/oxygen
                      atmospheres on NiO/YSZ substrates heated to between 500 and
                      700 degreesC. Dense and crack-free coatings were obtained in
                      the thickness range of 1 to 10 mum. The film morphology
                      varied from columnar to crystalline structure depending on
                      the oxygen pressure and the substrate temperature. Whereas
                      the coated films consisted of YSZ with cubic and tetragonal
                      crystal structure under low oxygen atmospheres, the same
                      deposition experiments on Al2O3 substrates revealed highly
                      disordered layers of cubic YSZ. The formation of oxide
                      layers on the NiO/YSZ substrates is due to a film-substrate
                      redox interaction. The NO grains close to the coating
                      interface are partially reduced and serve as an oxygen
                      source for the oxidation of the film. An exponential decay
                      of the gas leakage vs. coating thickness was found. (C) 2001
                      Elsevier Science Ltd. All rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {IWV-1},
      ddc          = {660},
      cid          = {I:(DE-Juel1)VDB5},
      pnm          = {Werkstoff- und Bauteilentwicklung für die
                      Hochtemperatur-Brennstoffzelle / SOFC - Solid Oxide Fuel
                      Cell (SOFC-20140602)},
      pid          = {G:(DE-Juel1)FUEK22 / G:(DE-Juel1)SOFC-20140602},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000170430000124},
      doi          = {10.1016/S0955-2219(01)00127-3},
      url          = {https://juser.fz-juelich.de/record/40486},
}