Journal Article PreJuSER-40486

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DC-sputtering of yttria-stabilised zirconia films for solid oxide fuel cell applications

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2001
Elsevier Science Amsterdam [u.a.]

Journal of the European Ceramic Society 21, 1843 - 1846 () [10.1016/S0955-2219(01)00127-3]

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Abstract: Yttria-stabilised zirconia (YSZ) thin films were dc-sputtered and investigated with respect to surface morphology, microstructure and film-substrate interface interaction. The films were deposited under argon/oxygen atmospheres on NiO/YSZ substrates heated to between 500 and 700 degreesC. Dense and crack-free coatings were obtained in the thickness range of 1 to 10 mum. The film morphology varied from columnar to crystalline structure depending on the oxygen pressure and the substrate temperature. Whereas the coated films consisted of YSZ with cubic and tetragonal crystal structure under low oxygen atmospheres, the same deposition experiments on Al2O3 substrates revealed highly disordered layers of cubic YSZ. The formation of oxide layers on the NiO/YSZ substrates is due to a film-substrate redox interaction. The NO grains close to the coating interface are partially reduced and serve as an oxygen source for the oxidation of the film. An exponential decay of the gas leakage vs. coating thickness was found. (C) 2001 Elsevier Science Ltd. All rights reserved.

Keyword(s): J ; films (auto) ; fuel cells (auto) ; yttria-stabilised zirconia (YSZ) (auto)


Note: Record converted from VDB: 12.11.2012

Contributing Institute(s):
  1. Werkstoffsynthese und Herstellungsverfahren (IWV-1)
Research Program(s):
  1. Werkstoff- und Bauteilentwicklung für die Hochtemperatur-Brennstoffzelle (11.10.0)
  2. SOFC - Solid Oxide Fuel Cell (SOFC-20140602) (SOFC-20140602)

Appears in the scientific report 2001
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 Record created 2012-11-13, last modified 2024-07-08



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