% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Levichkova:40904,
      author       = {Levichkova, M. and Mankov, V. and Starbov, N. and
                      Karashanova, D. and Mednikarov, B. and Starbova, K.},
      title        = {{S}tructure and properties of nanosized electron beam
                      deposited zirconia thin films},
      journal      = {Surface and coatings technology},
      volume       = {141},
      issn         = {0257-8972},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PreJuSER-40904},
      pages        = {70},
      year         = {2001},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Thin films of amorphous zirconium oxide are deposited in
                      high vacuum via the electron gun evaporation of pure ZrO2
                      within a large scale of vapour incidence angles. A nanosized
                      grain surface structure and columnar growth morphology are
                      revealed by electron optical methods. It is demonstrated
                      that the oblique deposition results in both column
                      inclination and anisotropy of the column cross section that
                      are related to the vapour beam incidence. The revealed
                      structure is found to influence the Knoop microhardness, DC
                      conductivity and the effective refractive index by inducing
                      in-plane anisotropy, which is most pronounced at high vapour
                      incidence angles. The dependence of these properties on the
                      vapour incidence is explained with the nanodimensionality of
                      the film morphological features. Finally, it is shown how an
                      excimer laser processing modifies both the structure and
                      properties of the zirconia films. (C) 2001 Elsevier Science
                      B.V. All rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {ISG-3},
      ddc          = {620},
      cid          = {I:(DE-Juel1)VDB43},
      pnm          = {Struktur und Dynamik von Grenzflächen},
      pid          = {G:(DE-Juel1)FUEK60},
      shelfmark    = {Materials Science, Coatings $\&$ Films / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000169277300010},
      doi          = {10.1016/S0257-8972(01)01162-8},
      url          = {https://juser.fz-juelich.de/record/40904},
}