Journal Article

PreJuSER-40906

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Oxide layers of Zr-1%Nb under PWR primary circuit conditions

Nagy, G. M.FZJ* ; Kerner, Z. ; Battistig, G.

2001
Elsevier Science Amsterdam [u.a.]

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Please use a persistent id in citations: doi:10.1016/S0022-3115(01)00596-7

Abstract: Oxide layers were grown on Zr-1% Nb under conditions simulating those in VVER-type pressurised water reactors (PWRs), viz. in berate solutions in an autoclave at 290 degreesC. The layers were characterised by various methods: their respective thickness values were determined by weight gain measurements, Rutherford backscattering (RBS), nuclear reaction analysis (NRA) and scanning electron microscopy (SEM); the electrical properties were tested by electrochemical impedance spectroscopy. The results show that the oxide layer on Zr-1% Nb is homogeneous and somewhat thicker than that on Zircaloy-4. (C) 2001 Elsevier Science B.V. All rights reserved.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Grenzflächen und Vakuumtechnologien (ISG-3)

Research Program(s):

1. Struktur und Dynamik von Grenzflächen (29.25.0)

Appears in the scientific report 2001

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