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@ARTICLE{Starbova:40926,
      author       = {Starbova, K. and Mankov, V. and Starbov, N. and Popov, D.
                      and Nihtianova, D. and Kolev, D. and Laude, L. D.},
      title        = {{P}hase transitions in excimer laser irradiated zirconia
                      thin films},
      journal      = {Applied surface science},
      volume       = {173},
      issn         = {0169-4332},
      address      = {Amsterdam},
      publisher    = {North-Holland},
      reportid     = {PreJuSER-40926},
      pages        = {177},
      year         = {2001},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {In the present work, excimer laser irradiation below the
                      ablation threshold is successfully applied as a tool for
                      surface modification of vapor grown amorphous zirconia
                      (ZrO2) thin films. Characterization of virgin and laser
                      processed areas was performed by optical spectroscopy,
                      transmission electron microscopy (TEM), selected area
                      electron diffraction (SAED), low angle X-ray diffraction
                      (LAXRD) and reflection high energy electron diffraction
                      (RHEED). The occurrence of phase transitions to orthorhombic
                      or monoclinic modification of amorphous zirconia on laser
                      parameters dependency is established. Separation of a new Zr
                      phase is detected in parallel to the formation of
                      crystalline zirconia phases. The observed structure
                      transformations strikingly coincide with some polymorphic
                      transitions in zirconia powders and sintered ceramics. The
                      results obtained demonstrate the necessity for applying both
                      surface and in-depth analytical techniques in characterizing
                      excimer laser induced changes in thin ZrO2 films. (C) 2001
                      Elsevier Science B.V. All rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {ISG-3},
      ddc          = {670},
      cid          = {I:(DE-Juel1)VDB43},
      pnm          = {Struktur und Dynamik von Grenzflächen},
      pid          = {G:(DE-Juel1)FUEK60},
      shelfmark    = {Chemistry, Physical / Materials Science, Coatings $\&$
                      Films / Physics, Applied / Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000167479800002},
      doi          = {10.1016/S0169-4332(00)00830-8},
      url          = {https://juser.fz-juelich.de/record/40926},
}