Journal Article

PreJuSER-43107

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Reversible and irreversible piezoelectric and ferroelectric response in ferroelectric ceramics and thin films

Bolten, D. ; Böttger, U. ; Waser, R.FZJ*

2004
Elsevier Science Amsterdam [u.a.]

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Please use a persistent id in citations: doi:10.1016/S0955-2219(03)00317-0

Abstract: In this article, a novel characterization method, the separation between reversible and irreversible contributions, is applied to the piezoelectric and ferroelectric response of ferroelectric ceramics and thin films. The reversible contributions are determined by the measurement of appropriate small-signal properties, e.g. the piezoelectric coefficient for the piezoelectric response and the small-signal capacitance for the polarization response of the material, and compared to the corresponding large signal properties (i.e. the strain-field dependence and polarization-field dependence, respectively). The comparison between thin films and bulk ceramics indicates that the non-180degrees domain wall motion in ferroelectric thin films is reduced compared to bulk ceramics. (C) 2003 Elsevier Ltd. All rights reserved.

Keyword(s): J ; dielectric properties (auto) ; ferroelectric properties (auto) ; piezoelectric properties (auto) ; PZT (auto)

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (IFF-IEM)
2. Center of Nanoelectronic Systems for Information Technology (CNI)

Research Program(s):

1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)

Appears in the scientific report 2004

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