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@ARTICLE{Hofer:43108,
      author       = {Hofer, C. and Meyer, R. and Böttger, U. and Waser, R.},
      title        = {{C}haracterization of {B}a({T}i,{Z}r){O}3 ceramics sintered
                      under reducing conditions},
      journal      = {Journal of the European Ceramic Society},
      volume       = {24},
      issn         = {0955-2219},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PreJuSER-43108},
      pages        = {1473 - 1477},
      year         = {2004},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Over the past few years, lead-free relaxor dielectrics have
                      become particularly interesting for industrial applications.
                      Due to the use of low cost base metal electrodes (BME),
                      reductive sample sintering is required. This contribution
                      refers to the influence of reducing sintering atmospheres on
                      the dielectric behaviour of Mn-doped Ba(TixZr1-x)O-3
                      ceramics with different Zr-contents (x = 0-100 $at.\%).$ It
                      was studied by impedance spectroscopy in the temperature
                      range T = -150-300 degreesC and the frequency range f= 5
                      mHz-10 MHz. For the interpretation of the impedance spectra
                      we used an equivalent electrical circuit to separate bulk
                      from grain boundary or electrode contributions,
                      respectively. It was found that reductive sintering
                      decreases the maximum dielectric constant by approx. $20\%.$
                      Further, a T-Curie, shift towards lower temperatures was
                      observed, In contrast to materials sintered under oxidizing
                      conditions, reduced sintered samples showed a plateau in the
                      T-Curie versus Zr-content plot, derived from the Curie-Weiss
                      behavior of the bulk in the cubic phase. (C) 2003 Elsevier
                      Ltd. All rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI},
      ddc          = {660},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000189247800113},
      doi          = {10.1016/S0955-2219(03)00573-9},
      url          = {https://juser.fz-juelich.de/record/43108},
}