%0 Journal Article
%A He, J. Q.
%A Vasco, E.
%A Jia, C. L.
%A Dittmann, R.
%T Microstructure of epitaxial BST/SRO bilayer films on SrTiO3 substrates
%J Journal of applied physics
%V 97
%@ 0021-8979
%C Melville, NY
%I American Institute of Physics
%M PreJuSER-45608
%P 104907
%D 2005
%Z Record converted from VDB: 12.11.2012
%X The thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strain and defects. The first sublayer extends for 3 nm from the lattice-coherent Ba0.7Sr0.3TiO3/SrRUO3 interface. The second 13-nm-thick sublayer forms a semicoherent interface with the first sublayer due to the creation of a misfit dislocation network. The third sublayer extends beyond the second sublayer exhibiting a structure characterized by compact columnar features. Planar defects are formed at the boundaries between such features. The formation of a layered structure within the Ba0.7Sr0.3TiO3 films is discussed in the light of the growth modes of films on lattice-mismatched substrates. (c) 2005 American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000230168100169
%R 10.1063/1.1897067
%U https://juser.fz-juelich.de/record/45608