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000045608 1001_ $$0P:(DE-Juel1)VDB11177$$aHe, J. Q.$$b0$$uFZJ
000045608 245__ $$aMicrostructure of epitaxial BST/SRO bilayer films on SrTiO3 substrates
000045608 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2005
000045608 300__ $$a104907
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000045608 520__ $$aThe thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strain and defects. The first sublayer extends for 3 nm from the lattice-coherent Ba0.7Sr0.3TiO3/SrRUO3 interface. The second 13-nm-thick sublayer forms a semicoherent interface with the first sublayer due to the creation of a misfit dislocation network. The third sublayer extends beyond the second sublayer exhibiting a structure characterized by compact columnar features. Planar defects are formed at the boundaries between such features. The formation of a layered structure within the Ba0.7Sr0.3TiO3 films is discussed in the light of the growth modes of films on lattice-mismatched substrates. (c) 2005 American Institute of Physics.
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000045608 7001_ $$0P:(DE-Juel1)VDB5020$$aJia, C. L.$$b2$$uFZJ
000045608 7001_ $$0P:(DE-Juel1)VDB5464$$aDittmann, R.$$b3$$uFZJ
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