TY  - JOUR
AU  - He, J. Q.
AU  - Vasco, E.
AU  - Jia, C. L.
AU  - Dittmann, R.
TI  - Microstructure of epitaxial BST/SRO bilayer films on SrTiO3 substrates
JO  - Journal of applied physics
VL  - 97
SN  - 0021-8979
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-45608
SP  - 104907
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - The thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strain and defects. The first sublayer extends for 3 nm from the lattice-coherent Ba0.7Sr0.3TiO3/SrRUO3 interface. The second 13-nm-thick sublayer forms a semicoherent interface with the first sublayer due to the creation of a misfit dislocation network. The third sublayer extends beyond the second sublayer exhibiting a structure characterized by compact columnar features. Planar defects are formed at the boundaries between such features. The formation of a layered structure within the Ba0.7Sr0.3TiO3 films is discussed in the light of the growth modes of films on lattice-mismatched substrates. (c) 2005 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000230168100169
DO  - DOI:10.1063/1.1897067
UR  - https://juser.fz-juelich.de/record/45608
ER  -