%0 Conference Paper
%A Chen, C.
%A Ross, C.
%A Podraza, N. J.
%A Wronski, C. R.
%A Collings, D. J.
%T Multichannel Mueller matrix analysis of the evolution of the microscopic roughness and texture during ZnO:Al chemical etching
%M PreJuSER-46334
%@ 0-7803-8707-4
%D 2005
%Z Record converted from VDB: 12.11.2012
%< Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference, Lake Buena Vista, Florida. - 2005. - 0-7803-8707-4. - S. 1524 - 1527
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Contribution to a conference proceedingsContribution to a book
%U https://juser.fz-juelich.de/record/46334