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Multichannel Mueller matrix analysis of the evolution of the microscopic roughness and texture during ZnO:Al chemical etching

 ;  ;  ;  ;

2005

ISBN: 0-7803-8707-4

Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference, Lake Buena Vista, Florida. - 2005. - 0-7803-8707-4. - S. 1524 - 1527

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Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
  1. Institut für Photovoltaik (IPV)
Research Program(s):
  1. Photovoltaik (E02)

Appears in the scientific report 2005
Notes: Proceedings
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Document types > Presentations > Conference Presentations
Institute Collections > IMD > IMD-3
Document types > Books > Books
Workflow collections > Public records
IEK > IEK-5
Publications database
 Record created 2012-11-13, last modified 2024-07-08
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