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001     46334
005     20240708133722.0
020 _ _ |a 0-7803-8707-4
037 _ _ |a PreJuSER-46334
100 1 _ |a Chen, C.
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245 _ _ |a Multichannel Mueller matrix analysis of the evolution of the microscopic roughness and texture during ZnO:Al chemical etching
260 _ _ |c 2005
295 1 0 |a Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference, Lake Buena Vista, Florida. - 2005. - 0-7803-8707-4. - S. 1524 - 1527
336 7 _ |a Contribution to a conference proceedings
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336 7 _ |a Contribution to a book
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336 7 _ |a Conference Paper
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500 _ _ |a Record converted from VDB: 12.11.2012
500 _ _ |3 Conference proceedings / Book
536 _ _ |a Photovoltaik
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700 1 _ |a Ross, C.
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700 1 _ |a Podraza, N. J.
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700 1 _ |a Wronski, C. R.
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700 1 _ |a Collings, D. J.
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914 1 _ |a Proceedings
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