TY  - JOUR
AU  - Reichenberg, B.
AU  - Tiedke, S.
AU  - Peter, F.
AU  - Waser, R.
AU  - Tappe, S.
AU  - Schneller, T.
TI  - Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin films
JO  - Journal of the European Ceramic Society
VL  - 25
SN  - 0955-2219
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - PreJuSER-47460
SP  - 2353
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - We have investigated the potential distribution on barium titanate thin filius with ail atomic force microscope in contact mode to find answers to the important question of local electric conductivity. A detailed knowledge about the electrical transport mechanisms is very important to receive a sound operation for highly integrated circuits such as non-volatile memory cells. With this paper we present an advanced method to perform these potential scans in galvanic contact. Key element of the set-up is an optimized electrometer amplifier which has an electronically reduced input capacitance avoiding the work function influence on the surface potential scan. To demonstrate the capability of our set-up we present example measurements performed on thermally reduced BaTiO3 thin films. (c) 2005 Elsevier Ltd. All rights reserved.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000230569300079
DO  - DOI:10.1016/j.jeurceramsoc.2005.03.195
UR  - https://juser.fz-juelich.de/record/47460
ER  -