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@ARTICLE{Reichenberg:47460,
      author       = {Reichenberg, B. and Tiedke, S. and Peter, F. and Waser, R.
                      and Tappe, S. and Schneller, T.},
      title        = {{C}ontact mode potentiometric measurements with an atomic
                      force microscope on high resistive perovskite thin films},
      journal      = {Journal of the European Ceramic Society},
      volume       = {25},
      issn         = {0955-2219},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PreJuSER-47460},
      pages        = {2353},
      year         = {2005},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {We have investigated the potential distribution on barium
                      titanate thin filius with ail atomic force microscope in
                      contact mode to find answers to the important question of
                      local electric conductivity. A detailed knowledge about the
                      electrical transport mechanisms is very important to receive
                      a sound operation for highly integrated circuits such as
                      non-volatile memory cells. With this paper we present an
                      advanced method to perform these potential scans in galvanic
                      contact. Key element of the set-up is an optimized
                      electrometer amplifier which has an electronically reduced
                      input capacitance avoiding the work function influence on
                      the surface potential scan. To demonstrate the capability of
                      our set-up we present example measurements performed on
                      thermally reduced BaTiO3 thin films. (c) 2005 Elsevier Ltd.
                      All rights reserved.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI},
      ddc          = {660},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000230569300079},
      doi          = {10.1016/j.jeurceramsoc.2005.03.195},
      url          = {https://juser.fz-juelich.de/record/47460},
}