Home > Publications database > Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin films > print

001     47460
005     20180210134007.0
024 7 _ |2 DOI
|a 10.1016/j.jeurceramsoc.2005.03.195
024 7 _ |2 WOS
|a WOS:000230569300079
037 _ _ |a PreJuSER-47460
041 _ _ |a eng
082 _ _ |a 660
084 _ _ |2 WoS
|a Materials Science, Ceramics
100 1 _ |a Reichenberg, B.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin films
260 _ _ |a Amsterdam [u.a.]
|b Elsevier Science
|c 2005
300 _ _ |a 2353
336 7 _ |a Journal Article
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336 7 _ |a Output Types/Journal article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
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440 _ 0 |a Journal of the European Ceramic Society
|x 0955-2219
|0 3891
|y 12
|v 25
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a We have investigated the potential distribution on barium titanate thin filius with ail atomic force microscope in contact mode to find answers to the important question of local electric conductivity. A detailed knowledge about the electrical transport mechanisms is very important to receive a sound operation for highly integrated circuits such as non-volatile memory cells. With this paper we present an advanced method to perform these potential scans in galvanic contact. Key element of the set-up is an optimized electrometer amplifier which has an electronically reduced input capacitance avoiding the work function influence on the surface potential scan. To demonstrate the capability of our set-up we present example measurements performed on thermally reduced BaTiO3 thin films. (c) 2005 Elsevier Ltd. All rights reserved.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
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653 2 0 |2 Author
|a electrical properties
653 2 0 |2 Author
|a atomic force microscope
653 2 0 |2 Author
|a defects
653 2 0 |2 Author
|a surfaces
700 1 _ |a Tiedke, S.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Peter, F.
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700 1 _ |a Waser, R.
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700 1 _ |a Tappe, S.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Schneller, T.
|b 5
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773 _ _ |a 10.1016/j.jeurceramsoc.2005.03.195
|g Vol. 25, p. 2353
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|q 25<2353
|0 PERI:(DE-600)2013983-4
|t Journal of the European Ceramic Society
|v 25
|y 2005
|x 0955-2219
856 7 _ |u http://dx.doi.org/10.1016/j.jeurceramsoc.2005.03.195
909 C O |o oai:juser.fz-juelich.de:47460
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913 1 _ |k I01
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|l Informationstechnologie mit nanoelektronischen Systemen
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914 1 _ |y 2005
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IFF-IEM
|l Elektronische Materialien
|d 31.12.2006
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920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
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980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
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