%0 Journal Article
%A Guo, X.
%A Vasco, E.
%A Mi, S.
%A Szot, K.
%A Wachsman, E.
%A Waser, R.
%T Ionic conduction in zirconia films on nanometer thickness
%J Acta materialia
%V 53
%@ 1359-6454
%C Amsterdam [u.a.]
%I Elsevier Science
%M PreJuSER-49699
%P 5161
%D 2005
%Z Record converted from VDB: 12.11.2012
%X Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000232859000020
%R 10.1016/j.actamat.2005.07.033
%U https://juser.fz-juelich.de/record/49699